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Fabrication of Ge1-xSnx based Photodetectors by Sputtering Epitaxy

Implementing Organization

Principal Investigator
Dr. Krista Roluahpuia Khiangte
Indian Institute Of Technology (IIT) Gandhinagar, Gujarat

Project Overview

The main aim of this project is to develop a cost-effective mass production of high quality epitaxial Ge1-xSnx alloys by sputtering epitaxy and fabricate p-i-n and metal-semiconductor-metal (MSM) infrared high-speed photodetectors, based on them. By addressing the challenges on the high lattice mismatched for Ge1-xSnx on Si (4.2 – 19%) and low solid solubility of Sn in Ge matrix (less than 1%), fabrication of high quality Ge1-xSnx epilayers by magnetron sputtering will be investigated. This will be followed by optimization of crystal quality and thermal stability of the Ge1-xSnx epilayers with special attention to high Sn content alloys of different nanostructures. After successful development of high-quality Ge1-xSnx epilayers, p-i-n and MSM photodetectors will be fabricated and this will be followed by photocurrent measurement of the devices.

Source

Source
Science and Engineering Research Board (SERB), DST 2022-23
Funding Organization
Quick Information
Area of Research
Physical Sciences
Start Date
2023
End Date
2026
Status
Ongoing
Contact
krista.khiangte@iitgn.ac.in
Output
No. of Research Paper
00
Technologies (If Any)
00
No. of PhD Produced
00
Publications
00
No. of Patents
Filed : 00
Grant : 00
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