Development of Methods in design-for-test (DFT), built-in self-test (BIST) for mixed-signal VLSI circuits and systems for mission critical applications

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Principal Investigator

Prof. Siddhartha Mukhopadhyay

Department of Electrical Engineering, Indian Institute of Technology (IIT), Kharagpur

Area of Research

Engineering Sciences

Focus Area

Development of DFT and BIST

Contact

smukh@ee.iitkgp.ernet.in

No. of Research Paper

Technologies (If Any)

No. of PhD Produced

Publications

No. of Patents

Filed : 00

Grant : 00

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