A Novel in situ Mechanical-FTIR Setup for Combined Optical Imaging and IR Vibrational Spectroscopy
Implementing Organization
Indian Institute of Technology (IIT)
Principal Investigator
Prof. Krishna Jonnalagadda
Associate Professor
|
Indian Institute of Technology (IIT), Mumbai
Mechanical Engineering
About
A novel in situ IR spectroscopy and optical deformation measurement device is being developed to understand the structure-property correlations in thin film materials. This device will help in understanding the mechanical response of thin polymer films produced via various processes where the microstructure either evolves with time or mechanical load. The main advantage of the device is also that it can be accommodated inside any commercially available FTIR spectroscope.
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