Associate Professor, Mechanical Engineering, Indian Institute of Technology (IIT), Mumbai
Project Overview
A novel in situ IR spectroscopy and optical deformation measurement device is being developed to understand the structure-property correlations in thin film materials. This device will help in understanding the mechanical response of thin polymer films produced via various processes where the microstructure either evolves with time or mechanical load. The main advantage of the device is also that it can be accommodated inside any commercially available FTIR spectroscope.
Associate Professor, Mechanical Engineering, Indian Institute of Technology (IIT), Mumbai
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