Development of Methods in design-for-test (DFT), built-in self-test (BIST) for mixed-signal VLSI circuits and systems for mission critical applications | India Science, Technology & Innovation - ISTI Portal

×

Acces sibility Controls

Development of Methods in design-for-test (DFT), built-in self-test (BIST) for mixed-signal VLSI circuits and systems for mission critical applications

Implementing Organization

Kalpana Chawala Space Technology Cell (KCSTC), Indian Institute of Technology (IIT), Kharagpur

Principal Investigator

Prof. Siddhartha Mukhopadhyay

Department of Mechanical Engineering, Indian Institute of Technology (IIT), Kharagpur, West Bengal

Department of Electrical Engineering

Related Research

Quick Information

Area of Research

Astronomy & Space Sciences

Focus Area

Development of DFT and BIST

Status

Ongoing

Output

No. of Research Paper

00

Technologies (If Any)

00

No. of PhD Produced

N/A

Startup (If Any)

00

No. of Patents

Filed :00

Grant :00