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Development of Spectrally Resolved white light interferometer for roughness and flatness measurement of engineering sample

Implementing Organization

CSIR-Central Scientific Instruments Organisation (CSIR-CSIO), Chandigarh
Principal Investigator
Dr. Sanjit Kumar Debnath
CSIR-Central Scientific Instruments Organisation (CSIR-CSIO), Chandigarh
CO-Principal Investigator
Dr. Shravan Kumar
CSIR-Central Scientific Instruments Organisation (CSIR-CSIO), Chandigarh

Project Overview

The objective is to develop a cost-effective optical instrument to measure roughness and flatness of engineering surfaces in vibration-sensitive environments. The Spectrally Resolved White Light Interferometry (SRWLI) method consists of an interferometer and spectroscope, which disperses white light interference patterns between the test and reference surfaces. The recorded interferogram is processed by a phase measurement algorithm. The project involves designing and fabricating the spectroscope, studying single-frame phase measurement algorithms, oto-mechanical design and assembly of the interferometer, integrating software with hardware, testing on standard samples, and developing a field deployable prototype. The SRWLI is based on white light interferometry, which is an incoherent superposition of a large number of monochromatic interferograms. The aim is to determine the phase Phiz, sigma as a function of sigma and determine z at any point on the test surface by a slope calculation. The phase ϯªz, sigma can be calculated using various methods like Fourier Transform and Hilbert Transform. This method is suitable for the Indian automobile industry, as it does not require vibration isolation and is cost-effective.
Funding Organization
Funding Organization
Department of Science and Technology (DST)
Quick Information
Area of Research
Physical Sciences
Focus Area
Engineering
Start Year
2024
End Year
2027
Sanction Amount
₹ 28.18 L
Status
Ongoing
Output
No. of Research Paper
00
Technologies (If Any)
00
No. of PhD Produced
N/A
Startup (If Any)
00
No. of Patents
Filed :00
Grant :00
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