Design and Characterization of Radiation Hardened standard Cell Library using Nanosheet Field Effect Transistors: Improving on Design Margins/Reliability
Implementing Organization
Sardar Vallabhbhai National Institute Of Technology
Principal Investigator
Dr. Abhishek Acharya
Sardar Vallabhbhai National Institute Of Technology
Project Overview
The proposal aims to develop radiation hardened devices for space, nuclear plants, and biomedical devices, enhancing machine learning capabilities with high-speed computation. The radiation hardened device design can be used to design radiation-hardened circuits. The project will address the design of Radiation hard Memory macro cells with IMC capability using Nanosheet Transistors for IoT and AI/ML applications. The project includes an atomicistic simulation and modeling framework for Nanosheet FETs, an in-depth analysis to identify the impact of Total Ionizing Dose (TID) and single Event Upsets/Transients (sET/sEU) on the Nanosheet FETs, a radiation hardened standard cell library with 440 cells and memory maco, a design of Near Threshold Voltage radiation hardened standard cells for data-intensive IoT and AI/ML applications, and an efficient tool for characterization of radiation hard NTV standard cells.