Fabrication of Ge1-xSnx based Photodetectors by Sputtering Epitaxy
Implementing Organization
Indian Institute of Technology (IIT)
Principal Investigator
Dr. Krista Roluahpuia Khiangte
Indian Institute Of Technology (IIT) Gandhinagar, Gujarat
About
The main aim of this project is to develop a cost-effective mass production of high quality epitaxial Ge1-xSnx alloys by sputtering epitaxy and fabricate p-i-n and metal-semiconductor-metal (MSM) infrared high-speed photodetectors, based on them. By addressing the challenges on the high lattice mismatched for Ge1-xSnx on Si (4.2 – 19%) and low solid solubility of Sn in Ge matrix (less than 1%), fabrication of high quality Ge1-xSnx epilayers by magnetron sputtering will be investigated. This will be followed by optimization of crystal quality and thermal stability of the Ge1-xSnx epilayers with special attention to high Sn content alloys of different nanostructures. After successful development of high-quality Ge1-xSnx epilayers, p-i-n and MSM photodetectors will be fabricated and this will be followed by photocurrent measurement of the devices.
Patents
0
Source
Source
Science and Engineering Research Board (SERB), DST 2022-23
Science and Engineering Research Board (SERB), New Delhi
Anusandhan National Research Foundation (ANRF)
Quick Information
Area of Research
Physical Sciences
Start Year
2023
End Year
2026
Sanction Amount
₹ 45.28 L
Status
Ongoing
Contact
krista.khiangte@iitgn.ac.in
Output
No. of Research Paper
00
Technologies (If Any)
00
No. of PhD Produced
00
No. of Patents
Filed :00
Grant :00
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