Genomics guided exploration for stress tolerance in wheat
Implementing Organization
Indian Institute of Wheat and Barley Research (IIWBR)
Principal Investigator
Dr. Ratan Tiwari
Scientist, Indian Institute of Wheat and Barley Research (IIWBR), Karnal
CO-Principal Investigator
Dr. Rajender Singh
Scientist, Indian Institute of Wheat and Barley Research (IIWBR), Karnal, Dr. Pradeep Sharma, Scientist, Indian Institute of Wheat and Barley Research (IIWBR), Karnal, Dr. Sonia Sheoran, Scientist, Indian Institute of Wheat and Barley Research (IIWBR), Karnal
Project Overview
Development / utilization of biparental, multi-parental and mutant populations for yield and abiotic stress related traits, and genomic analysis of abiotic stress responsive genes and their validation
Achievements
Multiparent and training population in wheat; Two EMS derived mutant lines DMW1820 and DMW1822 previously found resistant to yellow rust; Genome-wide analysis led to identification of 157 and 111 TaWRKY and TaSnRK family genes
Disclaimer:
Information available on this portal is sourced from various organizations and is provided for informational purposes only. Users are advised to verify details from the respective official sources.
Please enter your details
Please provide your name and email to continue. Your details are saved in this browser for future use.
Latest Updates
Loading…
⚠️
You are leaving this website
You are about to be redirected to an external website that is not operated by
India Science, Technology & Innovation (ISTI) Portal.