Scientist, Indian Institute of Wheat and Barley Research (IIWBR), Karnal
CO-Principal Investigator
Dr. Rajender Singh
Scientist, Indian Institute of Wheat and Barley Research (IIWBR), Karnal, Dr. Pradeep Sharma, Scientist, Indian Institute of Wheat and Barley Research (IIWBR), Karnal, Dr. Sonia Sheoran, Scientist, Indian Institute of Wheat and Barley Research (IIWBR), Karnal
Project Overview
Development / utilization of biparental, multi-parental and mutant populations for yield and abiotic stress related traits, and genomic analysis of abiotic stress responsive genes and their validation
Achievements
Multiparent and training population in wheat; Two EMS derived mutant lines DMW1820 and DMW1822 previously found resistant to yellow rust; Genome-wide analysis led to identification of 157 and 111 TaWRKY and TaSnRK family genes