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Research Projects

Large-signal RF reliability modeling & characterization of hot carrier degradation in 10- Nm FinFETs

Implementing Organization

Indian Institute of Technology (Delhi)
Principal Investigator
Dr. A. Dixit
Associate Professor, Indian Institute of Technology (Delhi)

Related Research

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Funding Organization
Funding Organization
Department of Science and Technology (DST)
Quick Information
Area of Research
Engineering Sciences
Focus Area
Device Physics and Reliability Engineering
Start Date
2019
Status
Completed
Output
No. of Research Paper
00
Technologies (If Any)
00
No. of PhD Produced
00
Publications
00
No. of Patents
Filed : 00
Grant : 00
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