Apparatus for Polarization vs Electric Field Measurement at Various Frequencies in Thin Film Samples | India Science, Technology & Innovation - ISTI Portal

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Apparatus for Polarization vs Electric Field Measurement at Various Frequencies in Thin Film Samples

Implementing Organization

National Physical Laboratory (NPL)

CSIR-Central Scientific Instruments Organisation (CSIR-CSIO), Chandigarh

Project Overview

Apparatus can be widely used in Electronics Instrumentation industries.

Benefits

Low cost compensation for lossy sample after evaluation of resistive losses in the sample.

Source

Source URL

www.nplindia.org

Related Research

Quick Information

Thrust Areas

Material Sciences

Focus Area

Electric Field Measurement

Output

TRL: Technology Readiness Level

Market Launch

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