FlawGuard: A Cost Effective Device for defect Detection in Wire during Cold Drawing | India Science, Technology & Innovation - ISTI Portal

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FlawGuard: A Cost Effective Device for defect Detection in Wire during Cold Drawing

Implementing Organization

National Metallurgical Laboratory (NML)

About

Test material diameter: 1.5 mm - 2.5 mm. Operating frequency: 10 Khz. Depth Resolution: 200 p. Drawing line speed: up to 12 m/s. LCD display. Software for data logging to identify defect location. Interfacing through LAN. Analog output for further signal analysis. Alarm: LED & Buzzer. Standalone as well as laptop based. Power Requirement: 220V/50Hz, Weight: 1.5 Kg; Dimension: 300 x 300 x 100 (all in mm).

Related Research

Quick Information

Area of Research

Chemical Sciences

Focus Area

Metallurgy

Status

completed

Output in Numbers

Research Paper

00

Technologies (If Any)

00

PhD Produced

N/A

Startup (If Any)

00

Patents

Filed :00

Grant :00