Dual Energy X-Ray Image Analysis Technique for Material Discrimination | India Science, Technology & Innovation - ISTI Portal

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Dual Energy X-Ray Image Analysis Technique for Material Discrimination

Implementing Organization

Central Electronics Engineering Research Institute (CEERI)

About

Luggage inspection in airports Identifcation of concealed items

Related Research

Quick Information

Area of Research

Physical Sciences

Focus Area

Material Discrimination

Status

completed

Output in Numbers

Research Paper

00

Technologies (If Any)

00

PhD Produced

N/A

Startup (If Any)

00

Patents

Filed :00

Grant :00